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Impact of the substrate orientation on CHC reliability in n-FinFETs – separation of the various contributions
Publication:
Impact of the substrate orientation on CHC reliability in n-FinFETs – separation of the various contributions
Date
2014
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tallarico, Andrea N.
;
Cho, Moon Ju
;
Franco, Jacopo
;
Ritzenthaler, Romain
;
Togo, Mitsuhiro
;
Horiguchi, Naoto
;
Groeseneken, Guido
;
Crupi, Felice
Journal
IEEE Transactions on Device and Materials Reliability
Abstract
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1876
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations
Metrics
Views
1876
since deposited on 2021-10-22
Acq. date: 2025-10-23
Citations