Publication:
Statistical model of the NBTI-induced threshold voltage, subthreshold swing, and transconductance degradations in advanced p-FinFETs
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1817 since deposited on 2021-10-23
Acq. date: 2026-02-24
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Statistics
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1817 since deposited on 2021-10-23
Acq. date: 2026-02-24
Citations