Publication:
Statistical model of the NBTI-induced threshold voltage, subthreshold swing, and transconductance degradations in advanced p-FinFETs
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1814 since deposited on 2021-10-23
1last month
Acq. date: 2025-12-15
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Views
1814 since deposited on 2021-10-23
1last month
Acq. date: 2025-12-15
Citations