Publication:
Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability
| dc.contributor.author | Afanas'ev, V. | |
| dc.contributor.author | Ravsher, Taras | |
| dc.contributor.author | Houshmand Sharifi, Shamin | |
| dc.contributor.author | Fantini, Andrea | |
| dc.contributor.author | Hody, Hubert | |
| dc.contributor.author | Witters, Thomas | |
| dc.contributor.author | Garbin, Daniele | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.author | Goux, Ludovic | |
| dc.contributor.author | Crotti, Davide | |
| dc.contributor.author | Kar, Gouri Sankar | |
| dc.contributor.imecauthor | Ravsher, Taras | |
| dc.contributor.imecauthor | Houshmand Sharifi, Shamin | |
| dc.contributor.imecauthor | Fantini, Andrea | |
| dc.contributor.imecauthor | Hody, Hubert | |
| dc.contributor.imecauthor | Witters, Thomas | |
| dc.contributor.imecauthor | Garbin, Daniele | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.imecauthor | Goux, Ludovic | |
| dc.contributor.imecauthor | Crotti, Davide | |
| dc.contributor.imecauthor | Kar, Gouri Sankar | |
| dc.contributor.orcidimec | Ravsher, T.::0000-0001-7862-5973 | |
| dc.contributor.orcidimec | Ravsher, Taras::0000-0001-7862-5973 | |
| dc.contributor.orcidimec | Garbin, Daniele::0000-0002-5884-1043 | |
| dc.contributor.orcidimec | Van Houdt, Jan::1234-1234-1234-1235 | |
| dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
| dc.date.accessioned | 2022-03-17T13:38:56Z | |
| dc.date.available | 2022-03-17T13:38:56Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/IMW51353.2021.9439629 | |
| dc.identifier.eisbn | 978-1-7281-8517-0 | |
| dc.identifier.issn | 2330-7978 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39496 | |
| dc.publisher | IEEE | |
| dc.source.beginpage | 111 | |
| dc.source.conference | IEEE International Memory Workshop (IMW) | |
| dc.source.conferencedate | MAY 16-19, 2021 | |
| dc.source.conferencelocation | Virtual | |
| dc.source.endpage | 114 | |
| dc.source.journal | na | |
| dc.source.numberofpages | 4 | |
| dc.title | Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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