Publication:

Evidences of areal switching in Vacancy-Modulated Conductive Oxide (VMCO) memory

Date

2017
Journal article
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dc.contributor.authorCelano, Umberto
dc.contributor.authorGastaldi, Carlotta
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorRichard, Olivier
dc.contributor.authorBender, Hugo
dc.contributor.authorGoux, Ludovic
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorVandervorst, Wilfried
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.accessioned2021-10-24T03:20:37Z
dc.date.available2021-10-24T03:20:37Z
dc.date.issued2017
dc.identifier.issn0167-9317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27988
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0167931717301958
dc.source.beginpage122
dc.source.endpage124
dc.source.journalMicroelectronic Engineering
dc.source.volume178
dc.title

Evidences of areal switching in Vacancy-Modulated Conductive Oxide (VMCO) memory

dc.typeJournal article
dspace.entity.typePublication
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