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FOND (Fully Overlapped Nitride-Etch Defined Device): A New Device Architecture for High-Reliability and High-Performance Deep Submicron CMOS Technology
Publication:
FOND (Fully Overlapped Nitride-Etch Defined Device): A New Device Architecture for High-Reliability and High-Performance Deep Submicron CMOS Technology
Date
1994
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mieville, Jean-Paul
;
Van den Bosch, Geert
;
Deferm, Ludo
;
Bellens, Rudi
;
Groeseneken, Guido
;
Maes, Herman
;
Schoenmaker, Wim
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2093
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2093
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations