Publication:
FOND (Fully Overlapped Nitride-Etch Defined Device): A New Device Architecture for High-Reliability and High-Performance Deep Submicron CMOS Technology
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2101 since deposited on 2021-09-29
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Acq. date: 2026-08-06
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Views
2101 since deposited on 2021-09-29
3last month
3last week
Acq. date: 2026-08-06
Citations