Publication:
Atomistic understanding of a single gated dopant atom in a MOSFET
Date
dc.contributor.author | Lansbergen, G. | |
dc.contributor.author | Rahman, R. | |
dc.contributor.author | Wellard, C. | |
dc.contributor.author | Caro, J. | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Biesemans, Serge | |
dc.contributor.author | Klimeck, G. | |
dc.contributor.author | Hollenberg, L. | |
dc.contributor.author | Rogge, S. | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Biesemans, Serge | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.date.accessioned | 2021-10-17T08:09:10Z | |
dc.date.available | 2021-10-17T08:09:10Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13985 | |
dc.source.beginpage | 1067-B03-07 | |
dc.source.conference | Materials and Devices for "Beyond CMOS" Scaling | |
dc.source.conferencedate | 24/03/2008 | |
dc.source.conferencelocation | San Francisco, CA USA | |
dc.title | Atomistic understanding of a single gated dopant atom in a MOSFET | |
dc.type | Proceedings paper | |
dspace.entity.type | Publication | |
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