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Reliability of ultra-thin dielectrics for giga scale silicon technologies
Publication:
Reliability of ultra-thin dielectrics for giga scale silicon technologies
Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Maes, Herman
;
Degraeve, Robin
;
Nigam, Tanya
;
De Blauwe, Jan
;
Groeseneken, Guido
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Abstract
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1931
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations
Metrics
Views
1931
since deposited on 2021-10-01
Acq. date: 2025-10-23
Citations