Publication:
The detrimental effect of a passivation on the electromigration lifetime of narrow Al-Si-Cu lines
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1881 since deposited on 2021-09-29
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Acq. date: 2026-02-25
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1881 since deposited on 2021-09-29
1last month
1last week
Acq. date: 2026-02-25
Citations