Publication:

Design and Characterization of Near-Infrared Sensitivity-Enhanced Three-Tap Fully Depleted Image Sensor for Fluorescence Lifetime Imaging

Date

2022
Journal article
https://doi.org/10.1109/JSEN.2022.3195766
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dc.contributor.authorChang, Yun-Tzu
dc.contributor.authorvan Dorpe, Pol
dc.contributor.authorCavaco, Celso
dc.contributor.authorVinci, Andrea
dc.contributor.authorSinha, Mitali
dc.contributor.authorBoulenc, Pierre
dc.contributor.authorSuss, Andreas
dc.contributor.authorVerschooten, Tom
dc.contributor.authorvan Hoof, Chris
dc.contributor.authorLee, Jiwon
dc.contributor.imecauthorChang, Yun-Tzu
dc.contributor.imecauthorvan Dorpe, Pol
dc.contributor.imecauthorCavaco, Celso
dc.contributor.imecauthorVinci, Andrea
dc.contributor.imecauthorSinha, Mitali
dc.contributor.imecauthorVerschooten, Tom
dc.contributor.imecauthorvan Hoof, Chris
dc.contributor.imecauthorLee, Jiwon
dc.contributor.orcidimecChang, Yun-Tzu::0000-0002-6897-5926
dc.contributor.orcidimecVan Dorpe, Pol::0000-0003-0918-1664
dc.contributor.orcidimecCavaco, Celso::0000-0001-9079-338X
dc.contributor.orcidimecVan Hoof, Chris::0000-0002-4645-3326
dc.contributor.orcidimecLee, Jiwon::0000-0003-3738-4872
dc.date.accessioned2023-03-30T10:27:04Z
dc.date.available2022-10-16T02:50:17Z
dc.date.available2023-03-30T10:27:04Z
dc.date.issued2022
dc.identifier.doi10.1109/JSEN.2022.3195766
dc.identifier.issn1530-437X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/40583
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage18428
dc.source.endpage18436
dc.source.issue19
dc.source.journalIEEE SENSORS JOURNAL
dc.source.numberofpages9
dc.source.volume22
dc.title

Design and Characterization of Near-Infrared Sensitivity-Enhanced Three-Tap Fully Depleted Image Sensor for Fluorescence Lifetime Imaging

dc.typeJournal article
dspace.entity.typePublication
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