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A discharge-based multi-pulse technique (DMP) for probing electron trap energy distribution in high-k materials for Flash memory applications

Date

2009
Proceedings Paper
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dc.contributor.authorZheng, X. F.
dc.contributor.authorZhang, W. .D
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorZhang, J. F.
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2021-10-18T05:47:49Z
dc.date.available2021-10-18T05:47:49Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16611
dc.source.beginpage139
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate7/12/2009
dc.source.conferencelocationBaltimore US
dc.source.endpage142
dc.title

A discharge-based multi-pulse technique (DMP) for probing electron trap energy distribution in high-k materials for Flash memory applications

dc.typeProceedings paper
dspace.entity.typePublication
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