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Physical properties of thin nitrided Hf silicates and their impact on the performance of advanced transistors having a TaN metal gate electrode
Publication:
Physical properties of thin nitrided Hf silicates and their impact on the performance of advanced transistors having a TaN metal gate electrode
Date
2005
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cubaynes, Florence
;
van der marel, C.
;
Hopstaken, M.J.P.
;
Van Elshocht, Sven
;
Everaert, Jean-Luc
;
Schaekers, Marc
Journal
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1974
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1974
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations