Publication:

On the Correlation Between Static and Low-Frequency Noise Parameters of Vertical Nanowire nMOSFETs

Date

2020-05
Meeting abstract
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dc.contributor.authorSimoen, Eddy
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorMatagne, Philippe
dc.contributor.authorRosseel, Erik
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorLoo, Roger
dc.contributor.authorFavia, Paola
dc.contributor.authorBender, Hugo
dc.contributor.authorVancoille, Eric
dc.contributor.authorHoriguchi, Naoto
dc.contributor.authorVeloso, Anabela
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorMatagne, Philippe
dc.contributor.imecauthorRosseel, Erik
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorVancoille, Eric
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.accessioned2021-10-29T04:11:07Z
dc.date.available2021-10-29T04:11:07Z
dc.date.issued2020-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35950
dc.identifier.urlhttps://ecs.confex.com/ecs/237/meetingapp.cgi/Paper/130820
dc.source.beginpage1394
dc.source.conferenceECS-2020 Spring Meeting, Symp H02:Advanced CMOS-Compatible Semiconductor Devices
dc.source.conferencedate10/05/2020
dc.source.conferencelocationMontreal Canada
dc.title

On the Correlation Between Static and Low-Frequency Noise Parameters of Vertical Nanowire nMOSFETs

dc.typeMeeting abstract
dspace.entity.typePublication
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