Recently added

A deep learning approach to crack detection in panel paintings

Sizyakin, Roman; Cornelis, Bruno; Meeus, Laurens; Martens, Maximiliaan; Voronin, Viacheslav; Pizurica, Aleksandra (2018)

Joint reconstruction and flat-field estimation using support estimation

Six, Nathanaël; De Beenhouwer, Jan; Van Nieuwenhove, Vincent; Vanroose, Wim; Sijbers, Jan (2018-11)

pDART: Discrete algebraic reconstruction using a polychromatic forward model

Six, Nathanaël; De Beenhouwer, Jan; Sijbers, Jan (2018-05)

Simplified rear-side patterning for silicon heterojunction IBC solar cells: development of the in situ "nano-envelope" dry clean

Sivaramakrishnan Radhakrishnan, Hariharsudan; Uddin, MD Gius; Xu, Menglei; Abdulraheen, Yaser; Gordon, Ivan; Szlufcik, Jozef; Poortmans, Jef (2018)

Implementation of a novel silicon heterojunction IBC process flow using partial etching of doped a-Si:H with efficiencies close to 23%

Sivaramakrishnan Radhakrishnan, Hariharsudan; Gius Uddin, M.D.; Xu, Menglei; Cho, Jinyoun; Ghannam, Moustafa; Gordon, Ivan; Szlufcik, Jozef; Poortmans, Jef (2018)

Cell and module fabrication options for kerfless thin (< 50 μm) epitaxial silicon foils: recent progress and challenges

Sivaramakrishnan Radhakrishnan, Hariharsudan; Cho, Jinyoun; Xu, Menglei; Roth, Julius; Bearda, Twan; Depauw, Valerie; Van Nieuwenhuysen, Kris; Gordon, Ivan; Szlufcik, Jozef; Poortmans, Jef (2018)

Overview of cell fabrication options for thin kerfless epi-Si foils: recent progress and challenges

Sivaramakrishnan Radhakrishnan, Hariharsudan; Cho, Jinyoun; Xu, Menglei; Bearda, Twan; Neubauer, Erich; Kovacova, Zuzana; Kaden, Thomas; Roozeman, R.; Heikkinen, J.; Syvertsen, M.; Ulyashin, A.G.; Röth, Julius; Depauw, Valerie; Van Nieuwenhuysen, Kris; Gordon, Ivan; Szlufcik, Jozef; Poortmans, Jef (2018)

Deep fingerprinting: undermining website fingerprinting defenses with deep learning

Sirinam, Payap; Imani, Mohsen; Juarez, Marc; Wright, Mattherw; Joosen, Wouter (2018)

Poster: Knowledge-enriched security and privacy threat modeling

Sion, Laurens; Yskout, Koen; Van landuyt, Dimitri; Joosen, Wouter (2018)

Risk-based design security analysis

Sion, Laurens; Yskout, Koen; Van landuyt, Dimitri; Joosen, Wouter (2018)

Solution-aware data flow diagrams for security threat modelling

Sion, Laurens; Yskout, Koen; Van landuyt, Dimitri; Joosen, Wouter (2018)

Interaction-based privacy threat elicitation

Sion, Laurens; Wuyts, Kim; Yskout, Koen; Van landuyt, Dimitri; Joosen, Wouter (2018)

SPARTA: Security & privacy architecture through risk-driven threat assessment

Sion, Laurens; Van landuyt, Dimitri; Yskout, Koen; Joosen, Wouter (2018)

Laser doping from PSG for selective FSF of screen printed rear-junction n-PERT cells

Singh, Sukhvinder; Tous, Loic; Choulat, Patrick; Chen, Jia; Liu, Ronglin; Ma, Liming; Wu, Xinghua; Wang, Jianming; Liu, Zhifeng; Duerinckx, Filip; Gordon, Ivan; Szlufcik, Jozef; Poortmans, Jef (2018)

Smart switchable biological surfaces for on-demand biosensing

Simoes, Barbara; Adriaensens, Peter; Guedens, Wanda; Goodwin, Paul; Mendes, Paula (2018)

The internet of robotic things: A review of concept, added value and applications

Simoens, Pieter; Dragone, M.; Saffiotti, A. (2018-01)

Junctionless versus inversion mode gate-all-around nanowire transistors from a low-frequency noise perspective

Simoen, Eddy; Veloso, Anabela; Matagne, Philippe; Collaert, Nadine; Claeys, Cor (2018)

Dry etch damage in n-type crystalline silicon wafers assessed by Deep-Level Transient Spectroscopy

Simoen, Eddy; Sivaramakrishnan Radhakrishnan, Hariharsudan; Uddin, MD Gius; Gordon, Ivan; Poortmans, Jef; Wang, Chong; Li, Wei (2018)

On the low-frequency noise of high-k gate stacks: what did we learn?

Simoen, Eddy; Ritzenthaler, Romain; Schram, Tom; Arimura, Hiroaki; Horiguchi, Naoto; Claeys, Cor (2018)

TaN versus TiN metal gate input/output pMOSFETs: a low-frequency noise perspective

Simoen, Eddy; O'Sullivan, Barry; Ritzenthaler, Romain; Dentoni Litta, Eugenio; Schram, Tom; Horiguchi, Naoto; Claeys, Cor (2018)

imec Publications: Recent submissions

A deep learning approach to crack detection in panel paintings ﻿

Joint reconstruction and flat-field estimation using support estimation ﻿

pDART: Discrete algebraic reconstruction using a polychromatic forward model ﻿

Simplified rear-side patterning for silicon heterojunction IBC solar cells: development of the in situ "nano-envelope" dry clean ﻿

Implementation of a novel silicon heterojunction IBC process flow using partial etching of doped a-Si:H with efficiencies close to 23% ﻿

Cell and module fabrication options for kerfless thin (< 50 μm) epitaxial silicon foils: recent progress and challenges ﻿

Overview of cell fabrication options for thin kerfless epi-Si foils: recent progress and challenges ﻿

Deep fingerprinting: undermining website fingerprinting defenses with deep learning ﻿

Poster: Knowledge-enriched security and privacy threat modeling ﻿

Risk-based design security analysis ﻿

Solution-aware data flow diagrams for security threat modelling ﻿

Interaction-based privacy threat elicitation ﻿

SPARTA: Security & privacy architecture through risk-driven threat assessment ﻿

Laser doping from PSG for selective FSF of screen printed rear-junction n-PERT cells ﻿

Smart switchable biological surfaces for on-demand biosensing ﻿

The internet of robotic things: A review of concept, added value and applications ﻿

Junctionless versus inversion mode gate-all-around nanowire transistors from a low-frequency noise perspective ﻿

Dry etch damage in n-type crystalline silicon wafers assessed by Deep-Level Transient Spectroscopy ﻿

On the low-frequency noise of high-k gate stacks: what did we learn? ﻿

TaN versus TiN metal gate input/output pMOSFETs: a low-frequency noise perspective ﻿

A deep learning approach to crack detection in panel paintings

Joint reconstruction and flat-field estimation using support estimation

pDART: Discrete algebraic reconstruction using a polychromatic forward model

Simplified rear-side patterning for silicon heterojunction IBC solar cells: development of the in situ "nano-envelope" dry clean

Implementation of a novel silicon heterojunction IBC process flow using partial etching of doped a-Si:H with efficiencies close to 23%

Cell and module fabrication options for kerfless thin (< 50 μm) epitaxial silicon foils: recent progress and challenges

Overview of cell fabrication options for thin kerfless epi-Si foils: recent progress and challenges

Deep fingerprinting: undermining website fingerprinting defenses with deep learning

Poster: Knowledge-enriched security and privacy threat modeling

Risk-based design security analysis

Solution-aware data flow diagrams for security threat modelling

Interaction-based privacy threat elicitation

SPARTA: Security & privacy architecture through risk-driven threat assessment

Laser doping from PSG for selective FSF of screen printed rear-junction n-PERT cells

Smart switchable biological surfaces for on-demand biosensing

The internet of robotic things: A review of concept, added value and applications

Junctionless versus inversion mode gate-all-around nanowire transistors from a low-frequency noise perspective

Dry etch damage in n-type crystalline silicon wafers assessed by Deep-Level Transient Spectroscopy

On the low-frequency noise of high-k gate stacks: what did we learn?

TaN versus TiN metal gate input/output pMOSFETs: a low-frequency noise perspective