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Recent submissions
imec Publications Repository
imec Publications
Recent submissions
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imec Publications: Recent submissions
Now showing items 4321-4340 of 42574
Online and offline social support deterioration: the effect of financial stress exposure on depressive symptoms
De Meulenaere, Jonas
;
Ponnet, Koen
;
Courtois, Cedric
;
Walrave, Michel
;
Hardyns, Wim
;
Pauwels, Lieven J. R.
(
2022
)
Improving the Measurement of Environmental Sensitivity in Children and Adolescents: The Highly Sensitive Child Scale-21 Item Version
Weyn, Sofie
;
Van Leeuwen, Karla
;
Pluess, Michael
;
Lionetti, Francesca
;
Goossens, Luc
;
Bosmans, Guy
;
Van den Noortgate, Wim
;
Debeer, Dries
;
Brohl, Anne Sophie
;
Bijttebier, Patricia
(
2022
)
The Role of Benzotriazole in Electrodeposition of Cu1-xNix Alloys (0.05 < x < 0.15) on Cu and Ni Substrates
Haesevoets, Karel
;
Philipsen, Harold
;
Vereecken, Philippe
(
2022-05-05
)
Simulation of polychromatic effects in high NA EUV lithography
Erdmann, Andreas
;
Mesilhy, Hazem
;
Evanschitzky, Peter
;
Saadeh, Qais
;
Soltwisch, Victor
;
Bihr, Simon
;
Zimmermann, Joerg
;
Philipsen, Vicky
(
2021
)
Infrared Colloidal Quantum Dot Image Sensors
Pejovic, Vladimir
;
Georgitzikis, Epimitheas
;
Lee, Jiwon
;
Lieberman, Itai
;
Cheyns, David
;
Heremans, Paul
;
Malinowski, Pawel
(
2022
)
TCAD Modeling of Temperature Activation of the Hysteresis Characteristics of Lateral 4H-SiC MOSFETs
Vasilev, Alexander
;
Jech, Markus
;
Grill, Alexander
;
Rzepa, Gerhard
;
Schleich, Christian
;
Tyaginov, Stanislav
;
Makarov, Alexander
;
Pobegen, Gregor
;
Grasser, Tibor
;
Waltl, Michael
(
2022-04-19
)
Extreme contact shrink for back end of line connectivity
Schleicher, Filip
;
Paolillo, Sara
;
Decoster, Stefan
;
Wu, Chen
;
Vega Gonzalez, Victor
;
Hasan, Mahmudul
;
Beral, Christophe
;
Lazzarino, Frederic
(
2022-05-10
)
Pupil optimization for after etch defectivity: what imaging metrics matter?
Frommhold, Andreas
;
Franke, Joern-Holger
;
Maslow, Mark J.
;
Nafus, Kathleen
;
Rispens, Gijsbert
(
2021
)
On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices
Putcha, Vamsi
;
Cheng, Liang
;
Alian, AliReza
;
Zhao, Ming
;
Lu, H.
;
Parvais, Bertrand
;
Waldron, Niamh
;
Linten, Dimitri
;
Collaert, Nadine
(
2021
)
Quarter-filled Kane-Mele Hubbard model: Dirac half metals
Mellaerts, S.
;
Meng, R.
;
Afanasiev, V
;
Seo, J. W.
;
Locquet, J-P
;
Houssa, Michel
(
2021
)
Total Ionizing Dose Effects of n-FinFET Transistor in iN14 Technology
Artola, L.
;
Nuns, T.
;
Cussac, G.
;
Chiarella, Thomas
;
Mitard, Jerome
(
2021
)
Surface Chemistry and Nanoscale Wet Etching of Group IV Semiconductors in Acidic H2O2 Solutions
lebedev, Mikhail
;
Mayer, Thomas
;
van Dorp, Dennis
;
Abrenica, Graniel
;
Arnauts, Sophia
;
Altamirano Sanchez, Efrain
;
De Gendt, Stefan
(
2021-02
)
Bayesian inverse reinforcement learning for strategy extraction in the iterated prisoner's dilemma game
Cami, M.
;
Terrucha, Ines
;
Khaluf, Yara
;
Simoens, Pieter
(
2021
)
Implementation-free forensic watermarking for adaptive streaming with A/B watermarking
Mareen, Hannes
;
Van Wallendael, Glenn
;
Lambert, Peter
(
2022
)
Electro-optic co-design for next generation silicon optical transmitters
Breyne, Laurens
;
Lambrecht, Joris
;
Vanhoecke, Michael
;
Ossieur, Peter
;
Roelkens, Gunther
;
Bauwelinck, Johan
;
Yin, Xin
(
2021
)
Comparison of two novel integral equation approaches for lossy conductor modeling
Huynen, Martijn
;
Gossye, Michiel
;
De Zutter, Daniel
;
Rogier, Hendrik
;
Vande Ginste, Dries
(
2021
)
Towards a personal data vault society: an interplay between technological and business perspectives
Van der Wee, M.
;
Verbrugge, Sofie
;
Vannieuwenborg, Frederic
;
Colle, Didier
;
Taelman, Ruben
;
Verborgh, Ruben
(
2021
)
On the SNOW Stream Ciphers
Kraleva, L
;
Li, C
(
2021
)
Selectivity Enhancement for Ruthenium Atomic Layer Deposition in Sub-50 nm Nanopatterns by Diffusion and Size-Dependent Reactivity
Grillo, Fabio
;
Van Ommen, Ruud
;
Clerix, Jan-Willem
;
Marques, Esteban
;
Soethoudt, Job
;
Pourtois, Geoffrey
;
Delabie, Annelies
(
2021-08-11
)
Reducing Library Characterization Time for Cell-aware Test while Maintaining Test Quality
Gao, Zhan
;
Hu, Min-Chun
;
Malagi, Santosh
;
Swenton, Joe
;
Huisken, Jos
;
Goossens, Kees
;
Marinissen, Erik Jan
(
2021-04-01
)
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