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200 mm Germanium-on-insulator(GeOI) by smart cut technology and recent GeOI MOSFETs achievements
Publication:
200 mm Germanium-on-insulator(GeOI) by smart cut technology and recent GeOI MOSFETs achievements
Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Akatsu, T.
;
Deguet, C.
;
Sanchez, L.
;
Richtarch, C.
;
Allibert, F.
;
Letertre, F.
;
Mazure, C.
;
Kernevez, N.
;
Clavelier, L.
;
Le Royer, C.
;
Hartmann, J.M.
;
Loup, V.
;
Meuris, Marc
;
De Jaeger, Brice
;
Raskin, G.
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2009
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
2009
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations