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Reliability of Porous Dielectrics
Publication:
Reliability of Porous Dielectrics
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Date
2005
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Beyer, Gerald
;
Schaekers, Marc
Journal
Abstract
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1885
since deposited on 2021-10-16
Acq. date: 2026-02-25
Citations
Statistics
Views
1885
since deposited on 2021-10-16
Acq. date: 2026-02-25
Citations