Authors

Breuil, Laurent; Haspeslagh, Luc; Blomme, Pieter; Lorenzini, Martino; Wellekens, Dirk; De Vos, Joeri; Van Houdt, Jan

Conference

Proceedings 43rd Annual International Reliability Physics Symposium

Title

Comparative reliability investigation of different nitride based local charge trapping memory devices

Publication type

Proceedings paper