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Comparative reliability investigation of different nitride based local charge trapping memory devices

dc.contributor.authorBreuil, Laurent
dc.contributor.authorHaspeslagh, Luc
dc.contributor.authorBlomme, Pieter
dc.contributor.authorLorenzini, Martino
dc.contributor.authorWellekens, Dirk
dc.contributor.authorDe Vos, Joeri
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-16T00:50:08Z
dc.date.available2021-10-16T00:50:08Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10150
dc.sourceIIOimport
dc.titleComparative reliability investigation of different nitride based local charge trapping memory devices
dc.typeProceedings paper
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorHaspeslagh, Luc
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorWellekens, Dirk
dc.contributor.imecauthorDe Vos, Joeri
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecDe Vos, Joeri::0000-0002-9332-9336
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewno
dc.source.beginpage181
dc.source.endpage185
dc.source.conferenceProceedings 43rd Annual International Reliability Physics Symposium
dc.source.conferencedate17/04/2005
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - imec


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