Write/erase degradation and disturb effects in source-side injection flash EEPROM devices

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Authors

Wellekens, Dirk; Van Houdt, Jan; Groeseneken, Guido; Maes, Herman; Faraone, Lorenzo

Issue

4

Journal

Quality and Reliability Engineering International

Volume

11

Title

Write/erase degradation and disturb effects in source-side injection flash EEPROM devices

Publication type

Journal article

Embargo date

9999-12-31

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Articles