Show simple item record

Extraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations

dc.contributor.authorCampera, A.
dc.contributor.authorIannaccone, G.
dc.contributor.authorCrupi, F.
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T00:52:10Z
dc.date.available2021-10-16T00:52:10Z
dc.date.issued2005-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10173
dc.sourceIIOimport
dc.titleExtraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations
dc.typeProceedings paper
dc.contributor.imecauthorGroeseneken, Guido
dc.source.peerreviewno
dc.source.beginpage35
dc.source.endpage38
dc.source.conference6th European Conference on Ultimate Integration of Silicon - ULIS
dc.source.conferencedate7/04/2005
dc.source.conferencelocationBologna Italy
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record