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Thin SiGe strain-relaxed buffer layers: relaxation mechanism and integration in strained Si MOS-FETs
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Authors
Caymax, Matty
;
Delhougne, Romain
;
Loo, Roger
;
Eneman, Geert
;
Verheyen, Peter
;
Ries, Michael
;
Luysberg, Martina
Conference
Institute of Thin Films and Interfaces
Title
Thin SiGe strain-relaxed buffer layers: relaxation mechanism and integration in strained Si MOS-FETs
Publication type
Oral presentation
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