Development of automatic OPC treatment and layout decomposition for double dipole lithography for low K1-imaging
dc.contributor.author | Chiou, T.-B. | |
dc.contributor.author | Chen, A. | |
dc.contributor.author | Hsu, Stephen D. | |
dc.contributor.author | Eurlings, M. | |
dc.contributor.author | Hendrickx, Eric | |
dc.date.accessioned | 2021-10-16T00:56:45Z | |
dc.date.available | 2021-10-16T00:56:45Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10216 | |
dc.source | IIOimport | |
dc.title | Development of automatic OPC treatment and layout decomposition for double dipole lithography for low K1-imaging | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Hendrickx, Eric | |
dc.source.peerreview | no | |
dc.source.beginpage | 21 | |
dc.source.endpage | 31 | |
dc.source.conference | Advanced Microlithographic Technologies | |
dc.source.conferencedate | 8/11/2004 | |
dc.source.conferencelocation | Bejing China | |
imec.availability | Published - imec | |
imec.internalnotes | Proceedings of SPIE; Vol. 5645 |
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