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Electrical and physical characterization of MOSFETs with MBE grown La2HfO7 and HfO2 high-k dielectrics integrated in a conventional flow
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1958 since deposited on 2021-10-16
Acq. date: 2025-10-23
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Views
1958 since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations