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Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switches
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Authors
Czarnecki, Piotr
;
Rottenberg, Xavier
;
Puers, Bob
;
De Wolf, Ingrid
Conference
Proceedings MEMSWAVE Workshop
Title
Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switches
Publication type
Proceedings paper
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