Show simple item record

Impact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switches

dc.contributor.authorCzarnecki, Piotr
dc.contributor.authorRottenberg, Xavier
dc.contributor.authorPuers, Bob
dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-10-16T01:04:34Z
dc.date.available2021-10-16T01:04:34Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10276
dc.sourceIIOimport
dc.titleImpact of biasing scheme and environment conditions on the lifetime of RF-MEMS capacitive switches
dc.typeProceedings paper
dc.contributor.imecauthorCzarnecki, Piotr
dc.contributor.imecauthorRottenberg, Xavier
dc.contributor.imecauthorPuers, Bob
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.source.peerreviewno
dc.source.beginpage133
dc.source.endpage136
dc.source.conferenceProceedings MEMSWAVE Workshop
dc.source.conferencedate23/06/2005
dc.source.conferencelocationLausanne Switzerland
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record