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Measuring nonlinear devices to retrieve good system-level models
Publication:
Measuring nonlinear devices to retrieve good system-level models
Date
2005
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Locht, Ludwig
;
Vandersteen, Gerd
;
Rolain, Yves
;
Rabijns, Daan
Journal
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1931
since deposited on 2021-10-16
Acq. date: 2025-10-26
Citations
Metrics
Views
1931
since deposited on 2021-10-16
Acq. date: 2025-10-26
Citations