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Measuring nonlinear devices to retrieve good system-level models

dc.contributor.authorDe Locht, Ludwig
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorRolain, Yves
dc.contributor.authorRabijns, Daan
dc.date.accessioned2021-10-16T01:08:31Z
dc.date.available2021-10-16T01:08:31Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10302
dc.sourceIIOimport
dc.titleMeasuring nonlinear devices to retrieve good system-level models
dc.typeOral presentation
dc.contributor.imecauthorVandersteen, Gerd
dc.source.peerreviewno
dc.source.conference66th ARFTG Conference
dc.source.conferencedate1/12/2005
dc.source.conferencelocationWashington D.C. USA
imec.availabilityPublished - imec


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