Authors

Guitard, Nicolas; Essely, Fabien; Tremouilles, David; Bafleur, Marise; Nolhier, Nicolas; Perdu, Philippe; Touboul, Andre; Pouget, Vincent; Lewis, Dean

Issue

9_11

Journal

Microelectronics Reliability

Volume

45

Title

Different failure signatures of multiple TLP and HBM stresses in an ESD robust protection structure

Publication type

Journal article