Authors

Hellin, David; Rip, Jens; Geens, Veerle; Delande, Tinne; Conard, Thierry; De Gendt, Stefan; Vinckier, Chris

Issue

7

Journal

Journal of Analytical Atomic Spectrometry

Volume

20

Title

Remediation for TXRF saturation effects on micro-droplet residues from preconcentration methods on semiconductor wafers

Publication type

Journal article