Publication:
GIDL (gate-induced drain leakage) and parasitic Schottky barrier leakage elimination in aggressively scaled HfO2/TiN FiNFET devices
Date
Loading...
Journal
Abstract
Description
Statistics
Views
2069 since deposited on 2021-10-16
1last month
Acq. date: 2026-02-25
Citations
Statistics
Views
2069 since deposited on 2021-10-16
1last month
Acq. date: 2026-02-25
Citations