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Negative bias temperature instability (NBTI) in SiO2 and SiON gate dielectrics understood through disorder-controlled kinetics
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1833 since deposited on 2021-10-16
1last month
Acq. date: 2026-02-28
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Statistics
Views
1833 since deposited on 2021-10-16
1last month
Acq. date: 2026-02-28
Citations