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Scaling CMOS: finding the gate stack with the lowest leakage current
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Scaling CMOS: finding the gate stack with the lowest leakage current
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Date
2005-04
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kauerauf, Thomas
;
Govoreanu, Bogdan
;
Degraeve, Robin
;
Groeseneken, Guido
;
Maes, Herman
Journal
Solid-State Electronics
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1812
since deposited on 2021-10-16
Acq. date: 2025-12-18
Citations
Metrics
Views
1812
since deposited on 2021-10-16
Acq. date: 2025-12-18
Citations