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Efficient cleaning of low-k materials using single-wafer cleaning solution: a compatibility study and electrical characterization
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Efficient cleaning of low-k materials using single-wafer cleaning solution: a compatibility study and electrical characterization
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Le, Quoc Toan
;
Van Olmen, Jan
;
Vanderheyden, Rudi
;
Kesters, Els
;
Kenis, Karine
;
Conard, Thierry
;
Boullart, Werner
;
Baklanov, Mikhaïl
;
Vanhaelemeersch, Serge
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1911
since deposited on 2021-10-16
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last month
Acq. date: 2025-12-18
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1911
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-18
Citations