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Overgrowth and defect characterization of strained Si/SiGe heterostructures on Si(100)
Publication:
Overgrowth and defect characterization of strained Si/SiGe heterostructures on Si(100)
Date
2005-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mantl, S
;
Buca, D.
;
Feste, S.
;
Hollander, B.
;
Lenk, St.
;
Loo, Roger
;
Caymax, Matty
;
Carius, R.
;
Schaefer, H.
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1944
since deposited on 2021-10-16
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1944
since deposited on 2021-10-16
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations