Publication:

Accurate determination of channel length, series resistance and junction doping profile for MOSFET optimisation in deep submicron technologies

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1934 since deposited on 2021-09-29
1last month
1last week
Acq. date: 2026-01-12

Citations

Metrics

Views

1934 since deposited on 2021-09-29
1last month
1last week
Acq. date: 2026-01-12

Citations