Publication:

Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe:C HBT

Date

2005-05
Proceedings Paper
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Author(s)

Piontek, Andreas
;
Choi, Li Jen
;
Van Huylenbroeck, Stefaan  
;
Vanhoucke, Tony
;
Hijzen, Erwin
;
Decoutere, Stefaan  

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1891 since deposited on 2021-10-16
Acq. date: 2025-10-23

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1891 since deposited on 2021-10-16
Acq. date: 2025-10-23

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