Authors

Piontek, Andreas; Choi, Li Jen; Van Huylenbroeck, Stefaan; Vanhoucke, Tony; Hijzen, Erwin; Decoutere, Stefaan

Conference

International Conference on Silicon Epitaxy and Heterostructures - ICSI

Title

Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe:C HBT

Publication type

Proceedings paper