Using multisines to measure state-of-the-art analog to digital converters

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Authors
Rabijns, Daan; Van Moer, Wendy; Vandersteen, Gerd; Schoukens, Johan
Conference
Proceedings of the IEEE Instrumentation and Measurement Technology Conference
Title
Using multisines to measure state-of-the-art analog to digital converters
Publication type
Proceedings paper
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