Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Using multisines to measure state-of-the-art analog to digital converters
Publication:
Using multisines to measure state-of-the-art analog to digital converters
Date
2005-05
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rabijns, Daan
;
Van Moer, Wendy
;
Vandersteen, Gerd
;
Schoukens, Johan
Journal
Abstract
Description
Metrics
Views
1967
since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations
Metrics
Views
1967
since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations