Show simple item record

Using multisines to measure state-of-the-art analog to digital converters

dc.contributor.authorRabijns, Daan
dc.contributor.authorVan Moer, Wendy
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorSchoukens, Johan
dc.date.accessioned2021-10-16T04:20:33Z
dc.date.available2021-10-16T04:20:33Z
dc.date.issued2005-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11070
dc.sourceIIOimport
dc.titleUsing multisines to measure state-of-the-art analog to digital converters
dc.typeProceedings paper
dc.contributor.imecauthorVandersteen, Gerd
dc.source.peerreviewyes
dc.source.beginpage7
dc.source.endpage12
dc.source.conferenceProceedings of the IEEE Instrumentation and Measurement Technology Conference
dc.source.conferencedate16/05/2005
dc.source.conferencelocationOttawa Canada
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record