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Hot-carrier degradation on the analogue/RF performances of a 90nm RF-CMOS technology demonstrated in a 900MHz low-power LNA

dc.contributor.authorRamos, Javier
dc.contributor.authorJeamsaksiri, Wutthinan
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorThijs, Steven
dc.contributor.authorLinten, Dimitri
dc.contributor.authorWambacq, Piet
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorDebusschere, Ingrid
dc.contributor.authorBiesemans, Serge
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-16T04:24:07Z
dc.date.available2021-10-16T04:24:07Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11081
dc.sourceIIOimport
dc.titleHot-carrier degradation on the analogue/RF performances of a 90nm RF-CMOS technology demonstrated in a 900MHz low-power LNA
dc.typeProceedings paper
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorDebusschere, Ingrid
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewno
dc.source.beginpage64
dc.source.endpage65
dc.source.conferenceProceedings IEEE VLSI-TSA International Symposium on VLSI Technology
dc.source.conferencedate25/04/2005
dc.source.conferencelocationHsinchu Taiwan
imec.availabilityPublished - imec


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