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Hot-carrier degradation on the analogue/RF performances of a 90nm RF-CMOS technology demonstrated in a 900MHz low-power LNA
Publication:
Hot-carrier degradation on the analogue/RF performances of a 90nm RF-CMOS technology demonstrated in a 900MHz low-power LNA
Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ramos, Javier
;
Jeamsaksiri, Wutthinan
;
Mercha, Abdelkarim
;
Thijs, Steven
;
Linten, Dimitri
;
Wambacq, Piet
;
De Jaeger, Brice
;
Debusschere, Ingrid
;
Biesemans, Serge
;
Decoutere, Stefaan
Journal
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1960
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
Metrics
Views
1960
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations