Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Hot-carrier degradation on the analogue/RF performances of a 90nm RF-CMOS technology demonstrated in a 900MHz low-power LNA
Publication:
Hot-carrier degradation on the analogue/RF performances of a 90nm RF-CMOS technology demonstrated in a 900MHz low-power LNA
Copy permalink
Date
2005
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ramos, Javier
;
Jeamsaksiri, Wutthinan
;
Mercha, Abdelkarim
;
Thijs, Steven
;
Linten, Dimitri
;
Wambacq, Piet
;
De Jaeger, Brice
;
Debusschere, Ingrid
;
Biesemans, Serge
;
Decoutere, Stefaan
Journal
Abstract
Description
Metrics
Views
1966
since deposited on 2021-10-16
4
last month
Acq. date: 2026-01-11
Citations
Metrics
Views
1966
since deposited on 2021-10-16
4
last month
Acq. date: 2026-01-11
Citations