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Hot-carrier degradation on the analogue/RF performances of a 90nm RF-CMOS technology demonstrated in a 900MHz low-power LNA

Date

2005
Proceedings Paper
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dc.contributor.authorRamos, Javier
dc.contributor.authorJeamsaksiri, Wutthinan
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorThijs, Steven
dc.contributor.authorLinten, Dimitri
dc.contributor.authorWambacq, Piet
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorDebusschere, Ingrid
dc.contributor.authorBiesemans, Serge
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorDebusschere, Ingrid
dc.contributor.imecauthorBiesemans, Serge
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-16T04:24:07Z
dc.date.available2021-10-16T04:24:07Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/11081
dc.source.beginpage64
dc.source.conferenceProceedings IEEE VLSI-TSA International Symposium on VLSI Technology
dc.source.conferencedate25/04/2005
dc.source.conferencelocationHsinchu Taiwan
dc.source.endpage65
dc.title

Hot-carrier degradation on the analogue/RF performances of a 90nm RF-CMOS technology demonstrated in a 900MHz low-power LNA

dc.typeProceedings paper
dspace.entity.typePublication
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