Publication:
Damage layer in silica-based low-k material induced by the patterning plasma process studied by energy-filtered TEM
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1885 since deposited on 2021-10-16
3last month
Acq. date: 2026-02-25
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Statistics
Views
1885 since deposited on 2021-10-16
3last month
Acq. date: 2026-02-25
Citations