Publication:

The low-frequency noise in n-MOSFETs on strained silicon: Is there room for improvement?

Date

2005-05

Proceedings Paper

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Files

10336.pdf 328.87 KB

Author(s)

;

;

Verheyen, Peter

;

Delhougne, Romain

;

Rooyackers, Rita

;

;

Vandervorst, Wilfried

;

De Meyer, Kristin

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Statistics

1793 since deposited on 2021-10-16

Acq. date: 2026-03-17