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The low-frequency noise in n-MOSFETs on strained silicon: Is there room for improvement?
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The low-frequency noise in n-MOSFETs on strained silicon: Is there room for improvement?
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Eneman, Geert
;
Verheyen, Peter
;
Delhougne, Romain
;
Rooyackers, Rita
;
Loo, Roger
;
Vandervorst, Wilfried
;
De Meyer, Kristin
;
Claeys, Cor
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1794
since deposited on 2021-10-16
Acq. date: 2026-07-16
Citations
Statistics
Views
1794
since deposited on 2021-10-16
Acq. date: 2026-07-16
Citations