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Characterization of extreme ultraviolet resists with interference lithography
Publication:
Characterization of extreme ultraviolet resists with interference lithography
Date
2005
Presentation
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Solak, Harun H.
;
Ekinci, Yasin
;
Gronheid, Roel
;
Jouve, Amandine
Journal
Abstract
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1973
since deposited on 2021-10-16
Acq. date: 2025-10-27
Citations
Metrics
Views
1973
since deposited on 2021-10-16
Acq. date: 2025-10-27
Citations