Publication:

Barrier reliability of ALD TaN on sub-100 nm copper low-k interconnects

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1969 since deposited on 2021-10-16
Acq. date: 2025-10-24

Citations

Metrics

Views

1969 since deposited on 2021-10-16
Acq. date: 2025-10-24

Citations