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Study of stress evolution during full silicidation for gate stacks
Publication:
Study of stress evolution during full silicidation for gate stacks
Date
2005-05
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Torregiani, Cristina
;
Kittl, Jorge
;
Capponi, Simona
;
Vanhoyland, Geert
;
Brongersma, Sywert
;
Lauwers, Anne
;
Van Houtte, Paul
;
Maex, Karen
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1901
since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations
Metrics
Views
1901
since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations