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Transient voltage overshoot in TLP testing - real or artifact
Publication:
Transient voltage overshoot in TLP testing - real or artifact
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Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Tremouilles, David
;
Thijs, Steven
;
Mahadeva Iyer, Natarajan
;
Vassilev, Vesselin
;
Roussel, Philippe
;
Groeseneken, Guido
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1916
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Acq. date: 2026-01-09
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Views
1916
since deposited on 2021-10-16
2
last month
1
last week
Acq. date: 2026-01-09
Citations