dc.contributor.author | Tremouilles, David | |
dc.contributor.author | Thijs, Steven | |
dc.contributor.author | Mahadeva Iyer, Natarajan | |
dc.contributor.author | Vassilev, Vesselin | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-16T05:48:41Z | |
dc.date.available | 2021-10-16T05:48:41Z | |
dc.date.issued | 2005 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11335 | |
dc.source | IIOimport | |
dc.title | Transient voltage overshoot in TLP testing - real or artifact | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.source.peerreview | no | |
dc.source.beginpage | 152 | |
dc.source.endpage | 160 | |
dc.source.conference | Proceedings 27nd EOS/ESD Symposium | |
dc.source.conferencedate | 11/09/2005 | |
dc.source.conferencelocation | Anaheim, CA California | |
imec.availability | Published - imec | |