Resilience in all-optical label switching networks: a node dimensioning point of view

Thumbnail
Metadata
Show full item record
Authors
Van Caenegem, Ruth; Colle, Didier; Pickavet, Mario; Demeester, Piet
Conference
Asia-Pacific Optical Communications Conference - APOC
Title
Resilience in all-optical label switching networks: a node dimensioning point of view
Publication type
Meeting abstract
Collections