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Conference contributions
Resilience in all-optical label switching networks: a node dimensioning point of view
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Resilience in all-optical label switching networks: a node dimensioning point of view
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Date
2005-11
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Caenegem, Ruth
;
Colle, Didier
;
Pickavet, Mario
;
Demeester, Piet
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1881
since deposited on 2021-10-16
Acq. date: 2025-12-16
Citations
Metrics
Views
1881
since deposited on 2021-10-16
Acq. date: 2025-12-16
Citations